IEC 61000-4-11:2020 pdf free.Electromagnetic compatibility (EMC)-Testing and measurement techniques – Voltage dips,short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase.
Electrical and electronic equipment can be affected by voltage dips,short interruptions orvoltage variations of the power supply.
Voltage dips and short interruptions occur due to faults in a (public or non-public) network orin installations by sudden changes of large loads. In certain cases, two or more consecutivedips or interruptions can occur.Voltage variations are caused by continuously varying loadsconnected to the network.
These phenomena are random in nature and can be minimally characterized for the purposeof laboratory simulation in terms of the deviation from the rated voltage and duration.
Consequently, different types of tests are specified in this document to simulate the effects ofabrupt voltage change. These tests are to be used only for particular and justified cases,under the responsibility of product specification or product committees.
lt is the responsibility of the product committees to establish which phenomena among theones considered in this document are relevant and to decide on the applicability of the test.
The voltages in this document use the rated voltage for the equipment(Ut) as a basis for thevoltage test level specification.
Where the equipment has a rated voltage range the following shall apply:
if the voltage range does not exceed 20 % of the lower voltage specified for the rated voltage range, a single voltage within that range may be specified as a basis for the testlevel specification (UT);
in all other cases,the test procedure shall be applied for both the lowest and highest voltages declared in the voltage range;
The preferred test levels and durations given in Table 1 and Table 2 take into account theinformation given in lEC TR 61000-2-8.
The preferred test levels in Table 1 are reasonably severe, and are representative of manyreal world dips, but are not intended to guarantee immunity to all voltage dips.More severedips, for example 0 % for 1 s and balanced three-phase dips,may be considered by productcommittees.
The generator specification for voltage rise time,t. and voltage fall time, t,during abruptchanges is indicated in Table 4.
The levels and durations shall be given in the product specification. A test level of 0 %corresponds to a total supply voltage interruption. in practice, a test voltage level from 0 % to20 % of the rated voltage may be considered as a total interruption.
Shorter durations in Table 1, in particular the half-cycle,should be tested to ensure that theequipment under test (EUT) operates within the performance limits specified for it.
When setting performance criteria for disturbances of a half-period duration for products witha mains transformer,product committees should pay particular attention to effects which canresult from inrush currents.For such products, these can reach 10 times to 40 times the ratedcurrent because of the magnetic flux saturation of the transformer core after the voltage dip.IEC 61000-4-11 pdf download.