IEEE 572-2019 pdf free.IEEE Standard for Qualification of Class 1 E Connection Assemblies for Nuclear Power Generating Stations and Other Nuclear Facilities.
qualified condition: The condition of equipment prior to the start of design basis event, for which the equipment was demonstrated to meet the design requirements for the specified service conditions.
qualified life: The period of time. prior to the start of a design basis event. fbr which the equipment was demonstrated to meet the design requirements for the specified service conditions.
significant aging mechanism: An aging mechanism that, under normal andor abnormal service conditions. causes degradation of equipment that progressively and appreciably renders the equipment vulnerable to failure to perform its safety function(s) during the design basis event conditions.
termination: A mechanical connection of two or murc components. uscd to transmit electrical currents or voltages.
4. Background
It is required that Class IE connection assemblies meet or exceed the specified performance requirements throughout their installed life. This is accoiiiplishcd through a quality assurance program thai includes, but is not limited to design. qualifIcation, production quality control, installation, maintenance, periodic testing. and surveillance. The qualification portion of the program is discussed in this standard The other steps in the quality assurance program require strict control to ensure that manufactured connection assemblies are consistent over time and are suitably applied, installed, maintained, and, where required, periodically tested. Maintenance of the qualification of connection assemblies may require action by the end user, such as replacement of glands or seals following disconnection in service. No specific condition monitoring activities ti.r connection assemblies have been identified.
Testing of each connection assembly site and configuration is not required if qualification lamilies are established by analysis based on the same generic design. use of the same production facilities, and produchon of the same thermal, electrical and mechanical stresses. Other IEEE standards, including fEC/IEEE 60780-323-2016, IEEE Sid 382-2006 and IEEE Std 317-2013. provide guidance.
Qualification of connection assemblies may be required for mating to existing connection assemblies or connection assemblies provided by others. In these cases, the connection assembly shall be qualified with the actual mating connection assembly to be installed in service. Intermatability to other connectors shall neither he assumed nor based on manufacturer’s certifications.
It is the primary role ofqualitication to ensure that (‘lass lI connection assemblies can peribmi as specified and that no failure mechanism exists that could lead to common cause tiilures under postulated service conditions.
It is the degradation with time (aging). followed by exposure to the environmental extremes of temperature. pressure, humidity, radiation, vibration, chemical spray, or submergence resulting from design basis events (DBE). extreme natural events, and severe accident conditions SAC). or a combination of these, which presents a potential for causing common cause failures ofCLass lE connection assemblies. For these reasons, it is necessary to establish a qualified life and qualified condition for connection assemblies required to functiona during andor following a DBE. exLremc natural event. andor SAC. The qualified condition is the state of degradation for which successful perftwmance during a subsequent design basis event was demonstrated. This shall be accomplished using the qualification methods described in 5. I through 5.4. including type testing. operaring experience, analysisas a supplement to type testing and operating experience, ongoing qualification. condition-based qualification in conjunction with type testing. or any combination thcrcoi
NOTE At the end of the qualified life, the equipment is capable of performing the safety function(s) required for the postulated design-basis and pos-design basis events (IEC1EFF 607S0-323-2016). A qualified life is not required for equipment located in a mild environment that has no significant aging mecharnsms,
Connection assemblies located in a mild environment area where the environment does not exceed the postulated normal and abnormal conditions during a DI3E (except seismic) may not require pre-aging prior to seismic testing to establish a qualified life or qualified condition. This is appropriate where data has demonstrated that the connection assembly can perform its Class IE function and has no significant aging mechanisms. If data shows that the connection assembly can perform its Class lE function, then the equipment’s qualified life and qualified condition may be equated to its design life. If evaluations of designs and applications of particular connection asseniblies so indicate. pre-aging prior to seismic testing is not required by this standard. Howcvcr, if the connector is disconnected for maintenance, periodic testing. or surveillance, then the number of connect-disconnect operations shall be simulated prior to seismic testing. The docwnentation required to qualify the connection assembly may be less than that required for connection assemblies described in the preceding paragraph.
For all qualification, the end result shall be documentation that demonstrates the connection assembly’s adequacy to perform its Class lE function(s). The documentation shall be in an auditablc form that allows verification by competent personnel, other than the qualifier, and shall contain the connection assembly’s qualification specification. documents that demonstrate compliance with the qualification specification and installation requirements. periodic inspection and maintenance requirements, summaries, information for maintaining qualification, and conclusions.IEEE 572 pdf download.