IEEE 592-2018 pdf free.IEEE Standard for Insulation Shields on Medium-Voltage (15 kV- 35 kV) Cable Joints and Separable Connectors.
To comply with this standard, accessories shall successfully pass the following tests:
a) Shield resistance: The shield resistance measured between the cable entrance and the farthest extremity of the shield from the cable entrance shall be 5000 (1 or less when tested as specified in 5.2.
b) Simulated touch current measurement: The maximum rms current passing to ground through a 10(X) resistance when energized at the maximum voltage rating shall not exceed 1.0 mA. when tested as specified in 5.3.
C) Fault-current initiation: The accessory shall be capable of initiating two consecutive arcing faults to ground, when tested as specified in 5.4.
5. Test procedures
5.1 Test specimens
lest specimens shall be clean and dry. A minimum number ot two test specimens shall he subjected to each test. The cable outside diameter used for testing in 5.3 and 5.4 can influence the results. Using a larger cable outside diameter will expand the accessory more than a smaller outside diameter increasing the overall resistance of the particular accessory’s insulation shield creating a more severe test. Therefore, the outside diameter of the insulation of the cable utilized for the tests must be within the upper 25% of the accessory’s range. If a cable is not readily available in this range, additional material, such as tape. heat shrink tube(s) or cold shrink lube(s) may be used to increase the outside diameter.
a) Family of Accessories. When testing accessories belonging to a family. tests shall be performed on the specific size accessory in the family that has the highest shield resistance as measured in 5.2. In addition, the cable used for testing must meet the requirements specified above.
b) led cable: The cable to be used in the test shall be of the same voltage class as the accessory tested and shall have a conductor and a metallic shield rated for the cfixtivc nns value of thc short time current to be applied during the test. The test cable shall not be smaller than a I/O aluminum, full neutral cable. The short circuit current carrying capacity of the mctallic shield and phase conductor may be determined in accordance with ICEA P-45 482 and ICEA P-32 382. respectively. An initial conductor temperature of 40 °C and the specified clearing time should be used when calculations are made per the ICEA standards.
5.2 ShIeld resistance test
The resistance of the scmiconducting insulation shield shall be measured using the vohmctcr-ammctcr method, with either an ac (49—61 liz) ordc current supply. The current connections shall be as follows:
For a separable Insulated connector, the current connections shall be located on the shield at the cable entrance and at the farthest shield extremity. using a circumferential electrode at both locations to give a uniform current distribution.
For a joint. the current connections shall be located on the shield at the cable entrance and at the center of the joint, using a circumtIrentjal electrode at both points to give a uniftrin current distribution, Alternatively, the measurement can be performed between the two cable entrances if the geometry of the joint at the physical center does not lend itself to easy installation of the circumferential electrode. In this case the pass criterion shall be a maximum value of 10 000 Q.
The voltage shall be measured with the currern adjusted to 1.0 mA ±0.2 mA. The measurement shall be made within I mm after reaching the test current value. The voltage probes can be attached at current electrodes. However, this will result in including the contact resistance of the current electrodes in the test results.
a) Resistance measurements shall be made on test specimens having the following histories:
I) Unaged
2) Airovenagedfor5o4hat 121 °C±5 °C
b) Resistance measurements shall be made with the test specimen temperature at ambient temperature 10 °C to 40 °C) and at 90 °C ±5 °C.
5.3 Simulated touch current measurement
The purpose of this lest is to demonstrate that the design and recommended assembly instructions limit he likelihood of exposure to a hazardous voltage, should the exterior surface be contacted. For background infbniiation, see Annex A.
a) The test specimen shall be assembled onto the cable(s) in conformance with the manufacturer’s instructions.
b) The test shall be carried out at ambient temperature between 10°C and 40°C.
C) A metallic circumferential electrode, shall be placed without intentional air gaps around the outer shield of the specimen as far as possible from the ground bonding points:
I) In the case of separable connectors [see Figure I (a)I. the metallic electrode shall be placed at the end of the exposed shield opposite the cable metallic shield ground connection.
2) In the case of the joint. the metallic electrode shall be in the center of the body Isee Figure I (b)j
d) The metallic electrode shall be connected to ground through a milliammeter and a resistance of 1000 i, as shown in Figure I.
c) The simulated touch current shall be measured (through the 1000 resistor) with an ac test voltage (49 Hz to 61 Hz) of V, (see Table I) applied between the cable core conductor and the shield. The simulated touch current shall not exceed I mA.
1) For dual or multi-rated accessories, the applied voltage V1 shall correspond to the highest voltage rating of the accessory.IEEE 592 pdf download.