IEEE 837-2014 pdf free.IEEE Standard for Qualifying Permanent Connections Used in Substation Grounding.
Mechanical tests are to he conducted on new connections for electromagnetic withstand strength of the connection in accordance with Clause 7.
Mechanical test samples
Thc samples subjected to mechanical lest shall not be used for the sequential tests. Samples arc described in 7.2.1 and 7.2.2.
Sequential test samples
Current-temperature cycling. freeze-thaw, corrosion, and fault-current tests are to he conducted sequentially. Use the same samples for all tests conducted in accordance with Clause 8 through Clause II. Sample length is described in 8.2.4. Separate sample sets are used fir the sequential salt spray and sequential acid tests.
Connections description
A description adequate for complete identification of the test connections shall be included in the test report. This description shall include (and not limited to) manufacturer, model number, and the description of the type of connector.
Test assembly methods
All assembly details not specifically defined in this standard shall be completely described in the test report.
Connection preparation
Connections shall be prepared in accordance with the manufacturer’s recommendations for field installation.
The method of en%taIlauon and the installation tooling shall be in accordance with the nianut’acturers rccommcndations for field installation, Unless otherwise specified in the manufacturer’s instructions. thc connection. shall be installed in accordance with Figure 4 for the mechanical lests and Figure 6 for the sequential test.
When clamping bolts are employed, they shall be tightened to the torque specified in Table 2. unleis otherwise specified by the manufacturer.
This test is intended to detemiine if the connection would be damaged by the cleclromagnetic forces during a fault.
For a multi.range connection, electromagnetic force icsts shall be performed on the connection joining the largest-to-largest and largest-to–smallest conduclors for which the connection is designed.
For tests requiring copper conductors, the conductors used shall he a commercially available hard-drawn type. The selection of a hard-drawn conductor, rather than soft-drawn conductor, will result in a more stringent lest.
Electromagnetic force (EM F) test
The EMF lest will be conducted for connections used within the grid system. to join ground leads to the grid system, and for connections to rigid points used to join leads to equipment and structures.
EMF test samples
Four samples of each connection and conductor combination, as described in 7.1. shall be subjected to each EMF test. Conductor sizes considered shall not exceed 500 kcmil for a single connection and shall not exceed 250 kcmil for a parallel connection (i.e.. two conductors in lieu of a single conductor to achieve desired ampacity). Sizes below 24) AWG are rKt to be considered except in the case of a variable connection per 7.1.
EMF test configuration
Fach test sample consists of a 1.22 rn to l.3 m (4 in to 72 in) long section of hare conductor. The test assembly and connector shall not be restrained. A test configuration consists of a single connection used within the grid systcm. a connection used to join ground leads to the grid syslcm (Figure 4a). or a connection used to join the ground leads to equipment and structures (Figure 4b). Scribe marks shall be added at the connectorconductor interface.
Four samples of the same design shall be tested. One connection sample shall be tested at a time to ensure accurate determination of conductor movement.
For Figure 4a test configurations, the bus connections Idead ends) must be electrically and mechanically robust to prevent movement during the test. Figure 4h test configuration shall consist of one lest sample connector and a dead end bus connection. These test samples shall be connected to the rigid mounted plates and/or bus extensions. In both configurations, connections shall be mounted in the same horizontal plane and shall not be restrained.IEEE 837 pdf download.