IEC 61000-4-36-2020 pdf free.Electromagnetic compatibility (EMC)-Testing and measurement techniques – IEMl immunity test methods for equipment and systems.
There are many types of sources which are capable of generating electromagneticenvironments potentially causing intentional electromagnetic interference (IEMI).IEC 61000-2-13 [3]discusses the various environments that can be generated and categorises them in termsof time characteristics, frequency range and bandratio.Further details and actual examples areincluded within Annex B.
A key requirement of developing IEMl test methods and test levels is to achieve a goodunderstanding of the environment in which the victim equipment or system will be required tooperate. Within this document specific focus is provided for victim equipment that is integratedwithin a site or other fixed installation and it is generally assumed that such equipment is housedwithin a building.
IEMl phenomena are unlike other EMC standardised phenomena where assumptions can bemade about the general or average disturbance level arriving at victim equipment ports.lmportant parameters related to the lEMl interaction with victim systems which will affect thetest level include:
a)IEMI source parameters
1) frequency range of the source,
2) peak and average power of the source
3) pulse width,pulse repetition frequency, burst length of the source,
4) source mobility,
5) technical complexity of the source,
6) antenna characteristics and/or conducted injection method characteristics
b) the protection level of the equipment,system or installation
1) the range or distance between the IEMl source and the victim electronics,
2) the propagation channel loss including the properties of the intervening barriers(attenuation and absorption).
Once these characteristics of the lEMl source and environment are well understood,thenappropriate test methods and test levels for ports on the victim equipment can be determined.
One approach would be to take all of the lEMl source parameters of interest and combine themsuch that one set of test levels is derived.The disadvantage of this approach is that, shouldeffects be observed, it would be difficult to assign them to any single lEMl parameter set. Inaddition the combination of widely varying waveform characteristics would likely result in anextreme set of test levels.
Some lEMl sources generate waveforms/environments that are similar to other electromagnetic(EM) environments，for example electrostatic discharge (ESD) or lightning electromagneticpulse(LEMP).Analytical methods can be used to determine the amount of similarity betweeniEMl environments and other EM environments, in particular through the use of waveform norms(see lEC 61000-4-33[4]).Any deficiencies in the test evidence could be made up throughincreasing the distance between the lEMl source and the electronic systems of interest or byundertaking testing focussed on specific frequencies.IEC 61000-4-36 pdf download.