IEC 62951-6-2019 pdf free.Semiconductor devices – Flexible and stretchable semiconductor devices-Part 6: Test method for sheet resistance of flexible conducting films.
This part of lEC 62951 specifies terms,as well as the test method and report of sheetresistance of the flexible conducting film under bending and folding tests. The measurementmethods include the 2-point probe,4-point probe and Montgomery method,which can beapplied to in-situ and ex-situ measurement and the measurements of anisotropic sheetresistance.
Normative references
The following documents are referred to in the text in such a way that some or all of theircontent constitutes requirements of this document.For dated references,only the editioncited applies.For undated references, the latest edition of the referenced document (includingany amendments) applies.
ISo 291:2008, Plastics – Standard atmospheres for conditioning and testing
3Terms and definitions
For the purpose of this document,the following terms and definitions apply.
ISO and lEC maintain terminological databases for use in standardization at the followingaddresses:
IEC Electropedia: available at
Iso Online browsing platform: available at
3.1 resistivity inverse of the conductivity when this inverse exists.
3.2 sheet resistance resistance of thin films that are nominally uniform in thickness,which is the resistivity dividedby the thickness of conducting film.
3.3 resistance for a resistive two-terminal element or two-terminal circuit with terminals A and B, quotient ofthe voltage (IEC 60050-131:2008,131-11-56) uAB between the terminals by the electriccurrent i in the element or circuit.
3.4 contact resistance resistance between the surface of a material and the electric contact made to the surface.
3.5 radius distance from the centre of a circle to the circumference.
Note 1 to entry: The radius of a sphere is the radius of a great circle.[SOURCE: IEC 60050-113:2011,113-01-25]
3.6 radius of curvature at a point of a curve, radius of the osculating circle.
Note 1 to entry: The osculating circle is the circle tangent to a curve at a point that approaches at best the curvein the vicinity of the point.[SouRCE:IEC 60050-113:2011,113-01-30]
3.7 point probe method method for measuring the resistivity of a material, using two electric contacts to the material.IEC 62951-6 pdf download.